Surface-distortion measuring device and method

Optics: measuring and testing – Shape or surface configuration – By projection of coded pattern

Reexamination Certificate

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C356S603000

Reexamination Certificate

active

07869061

ABSTRACT:
A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means2capable of switching and displaying a plurality of kinds of light-and-shade patterns5, capturing means3for capturing mirror images, reflected in the specular or semi-specular surface of a measurement target1, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating means10for performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.

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patent: A-2005-3409 (2005-01-01), None

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