Method for detecting pattern of over-sampling image and an...

Details Method for detecting pattern of over-sampling image and an... Method for detecting pattern of over-sampling image and an...

2011-04-26

2011-04-26

Agustin, Peter Vincent (Department: 2627)

Dynamic information storage or retrieval

Specific detail of information handling portion of system

Radiation beam modification of or by storage medium

Reexamination Certificate

active

07933187

ABSTRACT:
Provided are a method for detecting a pattern of an over-sampling image and an optical information processing apparatus and method using the same. A method for detecting a pattern from an image of an over-sampled datapage includes: over-sampling the datapage to detect a detection image of the datapage; comparing the detection image and a reference image of over-sampling for the pattern by a covariance; and calculating a pixel of the pattern over-sampled by values of the reference image and the detection image compared by the covariance. Accordingly, data with a specific pattern such as a mark can be detected from an image of an over-sampled datapage, thereby making it possible to increase the data reproduction accuracy, thus making it possible to greatly increase the reliability of reproduced optical data.

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