Modified Michelson delay line interferometer

Details Modified Michelson delay line interferometer Modified Michelson delay line interferometer

2011-01-04

2011-01-04

Choi, William C (Department: 2873)

Optical: systems and elements

Single channel simultaneously to or from plural channels

By partial reflection at beam splitting or combining surface

C398S202000

Reexamination Certificate

active

07864430

ABSTRACT:
In an optical etalon with a fixed FSR determined by the cavity length, the time delay is adjusted by an etalon surface coating. The proper cavity length is chosen to achieve a desired FSR, and the coating is independently selected to obtain a desired time delay.

REFERENCES:
patent: 2008/0240736 (2008-10-01), Ji et al.

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