Electrical pin used in integrated circuit test sockets

Details Electrical pin used in integrated circuit test sockets Electrical pin used in integrated circuit test sockets

2011-03-15

2011-03-15

Davis, Antoine D (Department: 2917)

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

Design Patent

active

D0634228

CLAIM:
The ornamental design for an electrical pin used in integrated circuit test sockets, as shown and described.

REFERENCES:
patent: 4823078 (1989-04-01), Mohebban
patent: D351562 (1994-10-01), Moffatt et al.
patent: 5877618 (1999-03-01), Luebke et al.
patent: D410203 (1999-05-01), Beha
patent: D460702 (2002-07-01), Kaise
patent: D471828 (2003-03-01), Huang
patent: D500799 (2005-01-01), Olson
patent: D501415 (2005-02-01), Seymour
patent: D514963 (2006-02-01), Shionoiri et al.
patent: D571240 (2008-06-01), Chun
patent: D583266 (2008-12-01), Wong

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