Method and mechanism for extraction and recognition of...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing

Reexamination Certificate

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C716S124000

Reexamination Certificate

active

07908579

ABSTRACT:
Disclosed is an improved approach for organizing, analyzing, and operating upon polygon data which significantly reduces the amount of data required for processing while keeping elements non-interfacing with each other. According to one approach, clusters of elements are extracted which are then handled separately. In some approaches, a set of polygons forms a cluster if for any two polygons from the set of polygons there exists a sequence of polygons from the set such that the distance between any sequential polygons are less than or equal to a given threshold number. Rather than analyzing each and every polygon in the design, repetitive unique patterns are analyzed once, which are then replicated for all clusters which have the same repetitive pattern.

REFERENCES:
patent: 5771045 (1998-06-01), Ghavam et al.
patent: 7246343 (2007-07-01), Joshi et al.
patent: 2006/0048091 (2006-03-01), Joshi et al.
patent: 2006/0236299 (2006-10-01), Sahouria et al.
patent: 3176784 (1991-07-01), None
patent: 2005058029 (2005-06-01), None
Sato, M. et al. “A Theoretically Optimal and Practically Fast Algorithm for VLSI Geometric Design Rule Verification” IEEE International Symposium on Circuits and Systems (ISCAS '88), Jun. 7-9, 1988, vol. 2, pp. 1445-1448.
English translation of abstract for JP 3176784 published on Jul. 31, 1991.

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