Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2011-06-07
2011-06-07
Hoang, Quoc D (Department: 2894)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C257S329000
Reexamination Certificate
active
07955947
ABSTRACT:
Isolation regions for semiconductor substrates include dielectric-filled trenches and field oxide regions. Protective caps of dielectric materials dissimilar from the dielectric materials in the main portions of the trenches and field oxide regions may be used to protect the structures from erosion during later process steps. The top surfaces of the isolation structures are coplanar with the surface of the substrate. Field doping regions may be formed beneath the field oxide regions. To meet the demands of different devices, the isolation structures may have varying widths and depths.
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Note: The References Numbered 7-9 Were Submitted With the IDS filed on May 29, 2007, in U.S. Appl. No. 11/298,075, Which is Relied on for an Earlier Effective filing date Pursuant to 35 U.S.C. 120. Accordingly, Pursuant to 37 CFR 1.98(d), Those References are not Enclosed Herewith.
Advanced Analogic Technologies, Inc.
Hoang Quoc D
Patentability Associates
Tran Tony
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