Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-03-08
2011-03-08
Dunn, Drew A (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07904263
ABSTRACT:
The invention disclosed herein provides a computer implementable method for characterizing signals in a frequency domain spectrum where such signals may be a wideband signal while individually being of varied formats such as tones, analog modulation, digital modulation, etc. The invention employs statistical probability models where mean, standard deviation, histograms, and probability density functions are analogous to center frequency, bandwidth, frequency spectrum, and signal models, respectively. The invention reconstructs a frequency spectrum showing signals of interest.
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Dunn Drew A
Mancini Joseph A.
Sun Xiuquin
The United States of America as represented by the Secretary of
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