Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2011-06-28
2011-06-28
Nghiem, Michael P (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S117000, C702S118000, C702S122000
Reexamination Certificate
active
07970569
ABSTRACT:
A connection test apparatus includes a controlling section, controlling each connection test device to switch the operation mode between the first and the second modes such that a first connection test device among the connection test devices is in the first mode and the remaining connection devices are in the second mode, and controlling a signal generating circuit to output the connection test signal; and a judging section judging, on the basis of the response signal that the first connection test device outputs in response to the connection test signal, a state of connection of a first connector connected to the first connection test device and a first net including the first connector among the nets.
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“Japanese Office Action” mailed by JPO and corresponding to Japanese application No. 2008-541939 on Feb. 1, 2011, with English translation.
Kikuchi Mikiko
Nakano Kazuharu
Fujitsu Limited
Fujitsu Patent Center
Nghiem Michael P
Suarez Felix E
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