Semiconductor device, semiconductor device testing method,...

Details Semiconductor device, semiconductor device testing method,... Semiconductor device, semiconductor device testing method,...

2011-03-08

2011-03-08

Nguyen, Hoai-An D (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S701000, C714S719000

Reexamination Certificate

active

07902853

ABSTRACT:
A test signal to be supplied to a driver section when the driver section is subjected to an operation test is generated by a test circuit. In the test circuit, the test signal can be generated by a burn-in control circuit in accordance with a clock signal TESTCK supplied from an outside source.

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http://en.wikipedia.org/wiki/Multiplexer.
http://en.wikipedia.org/wiki/Multiplexing.
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