Positioning pattern

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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Reexamination Certificate

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07957931

ABSTRACT:
An absolute position detection device, system and method using a pattern comprising two types of position data: location of the pattern relative an object and position of the pattern relative a sensing device, e.g. a camera. The device comprise the sensing device acquiring images of the pattern located on the object and a computational unit analysing the images for determining absolute position of the object relative the sensing device. The present invention is realized in a number of applications, such as forming part of a torque sensor, a theodolite, an articulating arm, or an angular detector.

REFERENCES:
patent: 5214426 (1993-05-01), Minohara
patent: 5319577 (1994-06-01), Lee
patent: 5965879 (1999-10-01), Leviton et al.
patent: 6169396 (2001-01-01), Yokotani et al.
patent: 6172665 (2001-01-01), Bullister
patent: 6360948 (2002-03-01), Yang
patent: 6765195 (2004-07-01), Leviton
patent: 0729112 (1996-08-01), None
patent: WO 0165225 (2001-09-01), None
International Search Report, Jan. 26, 2007.

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