Semiconductor device and semiconductor memory tester

Details Semiconductor device and semiconductor memory tester Semiconductor device and semiconductor memory tester

2011-01-11

2011-01-11

Mai, Son L (Department: 2827)

Static information storage and retrieval

Format or disposition of elements

C365S063000, C257S686000, C257S723000, C257S777000

Reexamination Certificate

active

07869240

ABSTRACT:
A semiconductor device, a semiconductor memory tester, and a multi-chip package are provided. The semiconductor device includes a plurality of nonvolatile semiconductor memories; a boosting circuit which generates a boosted voltage for operating the plurality of nonvolatile semiconductor memories; and a boosting circuit controller which controls the operation of the boosting circuit to generate the boosted voltage on the basis of an operation sequence of the plurality of nonvolatile semiconductor memories.

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