Method and apparatus for generating temperature-compensated...

Static information storage and retrieval – Addressing – Plural blocks or banks

Reexamination Certificate

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C365S211000, C365S185030, C365S185210, C365S185220, C365S185230

Reexamination Certificate

active

07957215

ABSTRACT:
Methods and an apparatuses for generating a word-line voltage are disclosed. A word-line voltage generator includes a first current source, an adjustable current source, adjustable current sink, and a voltage converter, all operably coupled to a current sum node. The first current source generates a first current having a temperature coefficient substantially equal to a temperature coefficient of at least one-bit cell. The adjustable current source generates a second current that is substantially independent of a temperature change. The adjustable current sink sinks a third current that is substantially independent of a temperature change. The voltage converter is configured for generating a word-line signal having a word-line voltage proportional to a reference current, wherein the reference current comprises the first current, plus the second current, and minus the third current.

REFERENCES:
patent: 5229711 (1993-07-01), Inoue
patent: 5377156 (1994-12-01), Watanabe et al.
patent: 5446693 (1995-08-01), Okamoto
patent: 5539690 (1996-07-01), Talreja et al.
patent: 5581504 (1996-12-01), Chang
patent: 5673223 (1997-09-01), Park
patent: 5734609 (1998-03-01), Choi et al.
patent: 5828611 (1998-10-01), Kaneko et al.
patent: 5864504 (1999-01-01), Tanzawa et al.
patent: 5912489 (1999-06-01), Chen et al.
patent: 6009014 (1999-12-01), Hollmer et al.
patent: 6018235 (2000-01-01), Mikuni
patent: 6046944 (2000-04-01), Singh
patent: 6147914 (2000-11-01), Leung et al.
patent: 6175522 (2001-01-01), Fang
patent: 6255900 (2001-07-01), Chang et al.
patent: 6281743 (2001-08-01), Doyle
patent: 6285586 (2001-09-01), Lung et al.
patent: 6323630 (2001-11-01), Banba
patent: 6330195 (2001-12-01), Marr
patent: 6377090 (2002-04-01), Bruno
patent: 6452437 (2002-09-01), Takeuchi et al.
patent: 6473344 (2002-10-01), Kim et al.
patent: 6489835 (2002-12-01), Yu et al.
patent: 6489836 (2002-12-01), Yeong
patent: 6556478 (2003-04-01), Willis et al.
patent: 6559629 (2003-05-01), Fernald
patent: 6567302 (2003-05-01), Lakhani
patent: 6603702 (2003-08-01), Kojima
patent: 6642778 (2003-11-01), Opris
patent: 6650567 (2003-11-01), Cho et al.
patent: 6667904 (2003-12-01), Takeuchi et al.
patent: 6683481 (2004-01-01), Zhou et al.
patent: 6693843 (2004-02-01), Maffitt et al.
patent: 6714455 (2004-03-01), Banks
patent: 6738290 (2004-05-01), Lee et al.
patent: 6744676 (2004-06-01), Leung et al.
patent: 6801454 (2004-10-01), Wang et al.
patent: 6847240 (2005-01-01), Zhou
patent: 6853238 (2005-02-01), Dempsey et al.
patent: 6862213 (2005-03-01), Hamaguchi
patent: 6870766 (2005-03-01), Cho et al.
patent: 6934209 (2005-08-01), Marr
patent: 6954394 (2005-10-01), Knall et al.
patent: 6975542 (2005-12-01), Roohparvar
patent: 6982905 (2006-01-01), Nguyen
patent: 7005839 (2006-02-01), Wada
patent: 7034514 (2006-04-01), Tachibana et al.
patent: 7072238 (2006-07-01), Chae et al.
patent: 7113025 (2006-09-01), Washburn
patent: 7119528 (2006-10-01), Rasmus
patent: 7149132 (2006-12-01), Bedeschi et al.
patent: 7164604 (2007-01-01), Arakawa
patent: 7208987 (2007-04-01), McClure
patent: 7221588 (2007-05-01), Fasoli et al.
patent: 7274250 (2007-09-01), Hazucha et al.
patent: 7489556 (2009-02-01), Tanzawa
patent: 2006/0023505 (2006-02-01), Iizuka
patent: 10-302492 (1998-11-01), None
patent: 10-320983 (1998-12-01), None
patent: 2000-285692 (2000-10-01), None
patent: 2001-035177 (2001-02-01), None
Banba et al., “A CMOS Band-Gap Reference Circuit with Sub 1V Operation,” Symposium on VLSI Circuits, Digest of Technical Papers, 228-229 (1998).
Banba et al., “A CMOS Band-Gap Reference Circuit with Sub 1V Operation,” IEEE Journal of Solid-State Circuits, 670-674 (1999).
Kuijk, Karel E., “A Precision Reference Voltage Source,” IEEE Journal of Solid-State Circuits, 222-226 (1973).
Nozoe et al., “A 256Mb Multilevel Flash Memory with 2MB/s Program Rate for Mass Storage Applications,” IEEE International Solid-State Circuits Conference, Digest of Technical Papers, 110-111, 451 (1999).
Nozoe et al., “A 256-Mb Multilevel Flash Memory with 2-MB/s Program Rate for Mass Storage Applications,” IEEE Journal of Solid-State Circuits, 1544-1550 (1999).
Pierazzi et al., “Band-Gap References for Near 1-V Operation in Standard CMOS Technology,” IEEE Custom Integrated Circuits Conference, 463-466 (2001).
Ripamonti et al., “Low Power-Low Voltage Band Gap References for Flash-EEPROM Integrated Circuits: Design Alternatives and Experiments,” IEEE, 635-638 (1999).
Tanzawa et al., “Wordline Voltage Generating System for Low-Power Low-Voltage Flash Memories,” IEEE Journal of Solid-State Circuits, 55-63 (2001).
Yen et al., “A Precision CMOS Power-On-Reset Circuit with Power Noise Immunity for Low-Voltage Technology,” IEICE Trans. Electron, 778-784 (2004).

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