Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate
2011-05-17
2011-05-17
Sandvik, Benjamin P (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Of specified material other than unalloyed aluminum
C257SE21495, C257SE23141, C438S622000
Reexamination Certificate
active
07944054
ABSTRACT:
A semiconductor device includes a plurality of first group wiring layers laminated on a substrate, and each of the first group wiring layers having a wire formed with a first minimum wire width and a main dielectric film portion; and a plurality of second group wiring layers laminated on a top layer of the plurality of first group wiring layers and each of the second group wiring layers having a wire formed with a second minimum wire width greater than the first minimum wire width and a main dielectric film portion, wherein a main dielectric film portion in a bottom layer of the plurality of second group wiring layers has a relative dielectric constant which is substantially identical to a relative dielectric constant of main dielectric film portions of the other second group wiring layers, and Young's modulus of the main dielectric film portion in the bottom layer of the plurality of second group wiring layers is smaller than those of the main dielectric film portions of the other second group wiring layers and larger than those of main dielectric film portions of the first group wiring layers.
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Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Sandvik Benjamin P
Soderholm Krista
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