Semiconductor memory device and method for testing the same

Static information storage and retrieval – Addressing – Sync/clocking

Reexamination Certificate

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C365S189110, C365S189050

Reexamination Certificate

active

07872940

ABSTRACT:
Semiconductor memory device and method for testing the same includes a unit for characterized in that a burst length is increased in a test of a read operation and a write operation and a unit for connecting a plurality of banks to one data pad by sequentially and outputting the data.

REFERENCES:
patent: 6330196 (2001-12-01), Protzman
patent: 6546510 (2003-04-01), Mazumder et al.
patent: 7126865 (2006-10-01), Hong et al.
patent: 2004/0085832 (2004-05-01), Kanda et al.
patent: 2007/0088921 (2007-04-01), Kim et al.
patent: 2008/0151678 (2008-06-01), Ikeda et al.
patent: 10-2005-0074246 (2005-07-01), None
patent: 10-2005-0089900 (2005-09-01), None
patent: 10-0576453 (2006-04-01), None

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