Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2011-05-31
2011-05-31
Jarrett, Ryan A (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C118S708000
Reexamination Certificate
active
07953512
ABSTRACT:
The present invention provides a substrate processing system, a control method for a substrate processing apparatus, and a program for the system and/or method, each of which is intended to achieve effective control for a film-forming amount on processed substrates. The substrate processing system includes a substrate processing unit adapted for forming a film on each of the plurality of substrates; a pattern obtaining unit adapted for obtaining information about an arrangement pattern concerning arrangement of unprocessed substrates and processed substrates among the plurality of substrates; and a memory unit adapted for storing therein an arrangement/film-forming-amount model indicative of influence exerted on the film-forming amount on the substrates by the arrangement of the unprocessed substrates and processed substrates among the plurality of substrates. A calculation unit calculates an estimated film-forming amount on the substrates, in the case of the arrangement pattern, based on the arrangement/film-forming-amount model. Then, a determination unit determines whether or not the estimated film-forming amount calculated by the calculation unit is within a predetermined range. If the estimated film-forming amount calculated by the calculation unit is determined to be within the predetermined range, a control unit will control and drive the substrate processing unit to process the substrates.
REFERENCES:
patent: 2002/0014483 (2002-02-01), Suzuki et al.
patent: 2002/0045146 (2002-04-01), Wang et al.
patent: 2002-110552 (2002-04-01), None
Takahashi Toshihiko
Takenaga Yuichi
Wang Wenling
Yamaguchi Tatsuya
Yonezawa Masato
Jarrett Ryan A
Smith , Gambrell & Russell, LLP
Tokyo Electron Limitetd
LandOfFree
Substrate processing system, control method for substrate... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Substrate processing system, control method for substrate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate processing system, control method for substrate... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2624171