Semiconductor integrated circuit failure analysis using magnetic

Details Semiconductor integrated circuit failure analysis using magnetic Semiconductor integrated circuit failure analysis using magnetic

1997-07-29

2000-05-16

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324529, 324 95, G01R 3128

Patent

active

060642203

ABSTRACT:
Magnetic sensors are positioned adjacent a semiconductor integrated circuit under test while the circuit is subjected to selected electrical stimuli for purposes of failure analysis. The magnetic image data can be acquired from one or more selected locations about the circuit without any physical connection. By comparing the magnetic sensor information to a predetermined database of magnetic information acquired from known devices, failure modes can be identified. Conventional tester equipment can be used for providing the electrical stimuli to the device under test.

REFERENCES:
patent: 3303400 (1967-02-01), Allison
patent: 5073754 (1991-12-01), Henley
patent: 5150042 (1992-09-01), Look et al.
patent: 5543988 (1996-08-01), Brady et al.

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