Data storage circuits using a low threshold voltage output...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit

Reexamination Certificate

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Details

C327S202000, C326S095000

Reexamination Certificate

active

06304123

ABSTRACT:

CROSS-REFERENCES TO RELATED APPLICATIONS
Not Applicable.
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT
Not Applicable.
BACKGROUND OF THE INVENTION
The present embodiments relate to data storage circuits, and are more particularly directed to circuits such as registers and latches using a low threshold voltage output enable circuit.
In many modem circuit applications it is desirable to improve the speed of operation of the circuit application, and a common circuit application to which this desire applies is a register. A register is typically considered a device that is able to store information over time, where the storage time associated with the register is often one clock cycle. For further background
FIG. 1
illustrates a schematic of a register designated generally at
10
, where the following first discusses the components of register
10
followed by a description of its operation.
Register
10
includes an input
12
for receiving data D and an input
14
for receiving a clock signal CLK. Turning first to input
12
, it is connected to a first output enable circuit
16
, where circuit
16
is sometimes referred to in the art by other names such as a passgate or a transmission gate. In any event, output enable circuit
16
consists of a p-channel transistor
16
p
and an n-channel transistor
16
n
. A first source/drain of each transistor in circuit
16
is connected to input
12
, and a second source/drain of each of those transistors is connected to a node
17
which is further connected to an input of an inverter
18
. The output of inverter
18
is connected to the input of a feedback inverter
20
, and the output of feedback inverter
20
is connected to the input of inverter
18
. The output of inverter
18
is also connected to a node
19
which is connected to the input of a second output enable circuit
22
. Second output enable circuit
22
consists of a p-channel transistor
22
p
and an n-channel transistor
22
n
. A first source/drain of each transistor in second output enable circuit
22
is connected to the output of inverter
18
, and a second source/drain of each of those transistors is connected to a node
23
which is further connected to an input of an inverter
24
. The output of inverter
24
is connected to the input of a feedback inverter
26
, and the output of feedback inverter
26
is connected to the input of inverter
24
. In addition, the output of inverter
24
provides the data output Q for register
10
. Lastly, the clock signal CLK at input
14
is used to clock the transistors of output enable circuits
16
and
22
. More particularly, input
14
is connected directly to the gates of p-channel transistor
16
p and n-channel transistor
22
n
, and further to the input of an inverter
28
. The inverted clock signal (shown in
FIG. 1
as {overscore (CLK)}) from the output of inverter
28
is connected to the gates of n-channel transistor
16
n and p-channel transistor
22
p.
The operation of register
10
is now described and is also illustrated with reference to the timing diagram of
FIG. 2
, where
FIG. 2
across its top illustrates the clock signal CLK applied to register
10
. Generally, CLK is periodic with a fifty percent duty cycle during typical active mode operations, and as seen below the CLK transitions thereby cause data to pass through register
10
. However, by way of introduction to an important notion detailed later, note that the clock period is also shown for an extended time period between a time t
8
and a time t
9
to stay constant rather than cycling and, in the present example, to remain at a low level during this period. During this period, and as further appreciated below, register
10
remains inactive.
Turning now to the data transfer through register
10
during the active mode of operation, the following demonstrates the passage of data D from input
12
through the first stage of register
10
, where that stage consists of output enable circuit
16
as well as the two-inverter combination following it. To further discuss this data transfer, attention is first directed to the second row in
FIG. 2
, which illustrates the data D coupled to input
12
. For simplicity sake, prior to time t
0
unknown data is shown as input although CLK is active prior to t
0
. At t
0
, a first data bit D
1
is input to register
10
. Further, at t
0
, note that CLK is low and is applied to the gate of p-channel transistor
16
p
, while its inverted form, {overscore (CLK)}, is applied to the gate of n-channel transistor
16
n
. As a result, after some delay represented in
FIG. 2
between t
0
and t
1
, the low clock and its complement are enabling to one or both of transistors in output enable circuit
16
, which thereby passes D
1
from input
12
to node
17
as is shown by the third row in FIG.
2
. Note that the term “enabling” is known in the art, and indicates that the gate potential is sufficient to cause conduction along the conductive path (i.e., the source/drain) of the transistor to which the gate potential is connected. Next, D
1
at node
17
passes through and is inverted by inverter
18
, which thereby adds a one inverter delay to the signal as it continues to pass through register
10
and appears as {overscore (D
1
)} at node
19
, as shown at t
2
in the fourth row in FIG.
2
. At this point, therefore, one skilled in the art will appreciate that the data {overscore (D
1
)} is effectively latched at node
19
, and its state is further retained by the feedback operation of inverter
20
. In this regard, therefore, the combination of inverters
18
and
20
are referred to in this document as a data retention circuit.
Continuing with the data transfer through register
10
, the following completes the passage of data D through the second stage of register
10
, where that stage consists of output enable circuit
22
as well as the two-inverter combination following it. Once again looking to
FIG. 2
, at time t
3
CLK rises to a high level, and this transition and new level is applied to the gate of n-channel transistor
22
n
, while its inverted form, {overscore (CLK)}, is applied to the gate of p-channel transistor
22
p
. As a result, after some delay represented in
FIG. 2
between t
3
and t
4
, output enable circuit
22
operates via one or both of its transistors to pass {overscore (D
1
)} from node
19
to node
23
as is shown in the fifth row of FIG.
2
. Next, {overscore (D
1
)} at node
23
passes through and is inverted by inverter
24
, which thereby adds a one inverter delay to the signal and thereby concludes the path through register
10
since the data D then appears at output Q, as shown at t
5
in the final row of FIG.
2
. At this point, therefore, data D
1
is latched at output Q with its state further maintained by the feedback operation of inverter
26
, and that data may then be sampled by another circuit or the like requiring access to that data.
Having now demonstrated the passage of D
1
through register
10
during its active mode of operation, the discussion of the operation of register
10
is now concluded with a more detailed examination of its inactive mode. Specifically, after CLK goes low starting at t
6
, and following the other transitions through register
10
as described above, then from t
8
to t
9
there are no active transitions in register
10
since CLK remains low. During this time, therefore, the state of register
10
is unchanged. By way of introduction to an inventive aspect described later, however, it is noted that some of the transistors forming register
10
are conducting during this time, while other transistors are not. Finally, at t
9
, register
10
switches back to the active mode when CLK again transitions, and the next data bit, shown as D
2
in
FIG. 2
, is then processed in the same manner described above with respect to D
1
.
While register
10
and its operation has been long used and established in the art, recall that at the outset of this Background section it was noted that speed through devices is a key consideration. Furt

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