Sense circuit for a multi-level flash memory cell

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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Details

C365S205000, C365S185030, C365S185200

Reexamination Certificate

active

06191977

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a sense circuit of a flash memory device and, in particular, to a sense circuit of a flash memory device which sense, according to a clock signal having a constant period and a plurality of control signal, data on a flash memory cell capable of storing multi-level, and transforms it to binary data.
2. Related Prior Art
In general, in case of sensing information stored in a memory cell, sensing is done by comparing an amount of current flowing through the memory cell and that flowing through the reference memory cell.
A conventional memory cell is designed to store only one data and also a sense amplifier sensing such cell is designed to sense only one data. However, there is a problem in that storing only one data to one cell requires a plurality of memory cells in proportion to the amount of data and degrades the high-density integration of a device. To solve such problem, a memory cell which can store multi-level is developed. Accordingly, the memory cell has become to be able to store one or more data, and development of a sense amplifier which can precisely sense data stored in such cell has become necessary.
SUMMARY OF THE INVENTION
Therefore, the object of the present invention is to provide a sense circuit of a flash memory device which can sense, according to a clock signal having a constant period and a plurality of control signals, data on a flash memory cell capable of storing multilevel, trans form it to binary data.
A sense circuit according to the present invention to accomplish the above described object comprises a control signal generator for generating a plurality of voltage control signals, a clock signal having constant period and a plurality of control pulses according to a sense amplifier enable signal, a control voltage generator for generating multi-steps voltage according to the clock signal and the plurality of voltage control signals, sequentially supplying the multi-steps voltage to a program gate of the memory cell, generating a reference voltage according to the sense amplifier enable signal and supplying the reference voltage to a program gate of a reference cell; and a sense amplifier for sequentially comparing a plurality of data stored in the memory cell and a data of the reference cell, storing the result according to the control pulse and converting it into binary data.


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