Method for extracting long-equivalent wavelength interferometric

Details Method for extracting long-equivalent wavelength interferometric Method for extracting long-equivalent wavelength interferometric

1990-02-26

1991-10-08

Willis, Davis L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356360, G01B 402

Patent

active

050549243

ABSTRACT:
A process for extracting long-equivalent wavelength interferometric information from a two-wavelength polychromatic or achromatic interferometer. The process comprises the steps of simultaneously recording a non-linear sum of two different frequency visible light interferograms on a high resolution film and then placing the developed film in an optical train for Fourier transformation, low pass spatial filtering and inverse transformation of the film image to produce low spatial frequency fringes corresponding to a long-equivalent wavelength interferogram. The recorded non-linear sum irradiance derived from the two-wavelength interferometer is obtained by controlling the exposure so that the average interferogram irradiance is set at either the noise level threshold or the saturation level threshold of the film.

REFERENCES:
patent: 4832489 (1989-05-01), Wyant et al.

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