Semiconductor integrated circuit device with large-scale memory

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G06F 1100

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active

058257837

ABSTRACT:
A semiconductor integrated circuit device comprises, on a semiconductor chip, a large-scale memory as a main memory, a controller for controlling at least inputting data from the outside of the chip to the large-scale memory, and outputting data from the large-scale memory to the outside of the chip, and a self-test circuit for testing the large-scale memory. The self-test circuit includes a rewritable EEPROM, into which a self-test sequence is written. The self-test circuit tests the large-scale memory in accordance with the self-test sequence written in the EEPROM.

REFERENCES:
patent: 4970648 (1990-11-01), Capots
patent: 5396499 (1995-03-01), Urai

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