Integrated circuit carrier package test probe

Details Integrated circuit carrier package test probe Integrated circuit carrier package test probe

1980-05-19

1982-07-20

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

200245, 324 51, 324158P, G01R 3102

Patent

active

043408605

ABSTRACT:
An IC carrier package test probe including a test probe head which is formed to penetrate into the IC chip cavity of the carrier package and which includes an elastic base having a thin layer of metal foil affixed to the outer face thereof, which foil is slited for greater elasticity and which is disposed to make simultaneous contact with each interior lead contact point within the cavity to permit rapid electrical testing of the continuity of the carrier package circuitry.

REFERENCES:
patent: 4065717 (1977-12-01), Kattner et al.

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