Test probe retainer

Details Test probe retainer Test probe retainer

1999-03-12

2001-01-09

Nguyen, Vinh P. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

06172514

ABSTRACT:

BACKGROUND OF THE INVENTION
This invention relates to circuit board test fixtures and, more particularly, to a snap-in retainer for a test probe to be used with such a fixture.
Circuit boards are commonly tested by placing them in a test fixture and using one or more test probes at predetermined locations relative to the circuit board to evaluate circuit conditions at those locations. Toward that end, the test fixture typically includes a plate which is fixed relative to the circuit board. The plate is formed with a plurality of openings at various locations in registration with circuit board locations at which testing is to be done. The test probes are inserted through selected ones of the openings to effect the desired measurements. In the past, holding a test probe in an opening has been done in different ways. For example, it is known to press fit the test probe into an opening. With such an approach, it is difficult to assemble, remove and replace the test probe. It is also known to press fit the test probe into a retainer block and screw the retainer block to the test fixture plate. With this arrangement, tools are required to install and remove the test probe and it is also time consuming. In addition, both of the aforedescribed arrangements provide a risk that the test probe can be damaged when it is press fit into either the test fixture plate or the retainer block. It would therefore be desirable to provide a retainer for a test probe which overcomes the aforedescribed disadvantages.
In a particular application, the test fixture plate has a large number of openings closely spaced in a limited area. It is also required to move the test probes from opening to opening. The use of the aforedescribed arrangements are unsuitable for such an application, since the press fitting of the test probe into a plate opening presents obstacles to relocation of the test probe and the use of a retainer block takes up excessive space and is time consuming to move. It would therefore be desirable to provide an improved retainer which can be quickly moved from opening to opening without the use of any tools.
SUMMARY OF THE INVENTION
In accordance with the present invention, there is provided a retainer for removably securing a test probe or the like to a test fixture having a plate with at least one opening for receiving the test probe. The test probe has a cylindrical body with a forward end. The plate opening is circular and has a diameter larger tan the diameter of the cylindrical body of the test probe, and the plate opening is formed with a circumferential groove. The inventive retainer comprises a unitary member having a generally cylindrical central bore. The central bore has a diameter larger than the diameter of the test probe cylindrical body with a portion of the bore at a first end of the unitary member having a reduced diameter sized to snugly retain therein the forward end of the test probe cylindrical body. A forward section of the unitary member extends rearwardly from the first end and includes at least the reduced diameter portion of the bore. The forward section has an exterior configured for a snug fit within the plate opening. The unitary member has a circumferential bead on its exterior surface within the forward section and rearwardly of the reduced diameter portion of the bore, the bead being receivable in the circumferential groove of the plate opening.
In accordance with an aspect of this invention, the unitary member is further formed with an enlarged portion spaced rearwardly from the first end of the unitary member by a distance equal to the thickness of the plate. Accordingly, the enlarged portion functions as a stop during insertion of the retainer into the plate opening.
In accordance with another aspect of this invention, the unitary member is open to the central bore on opposed sides extending rearwardly from the rear of the reduced diameter portion to a region beyond the rear of the enlarged portion. Accordingly, compression of the enlarged portion toward the central bore moves the bead out of the groove to assist in removal of the member from the plate opening.


REFERENCES:
patent: 3866119 (1975-02-01), Aedezzone et al.
patent: 4101830 (1978-07-01), Greig
patent: 4739259 (1988-04-01), Hadwin et al.
patent: 4885533 (1989-12-01), Coe

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