Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
1998-11-23
2001-03-13
Metjahic, Safet (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S754120
Reexamination Certificate
active
06201401
ABSTRACT:
FIELD OF THE INVENTION
The present invention describes a method for the electrical characterization of semiconductor elements with a very high resolution. More particularly a method is disclosed for measuring the electrical potential and the electrical potential distribution in a semiconductor element with a resolution of the order of nanometers.
BACKGROUND OF THE INVENTION
With ever decreasing feature size of semiconductor devices, the potential distribution in the device during operation and related properties such as the electrical field distribution and the extent of space-charge regions next to junctions are of great interest. Knowledge of these quantities with nanometer resolution becomes crucial for activities such as TCAD device simulator development and also for manufacturing process evaluation. Simulation software for submicron devices needs reliable data provided by characterization techniques for calibration. Measurement techniques therefore must be simple, have a high spatial resolution and sensitivity, have to be applicable to both conducting and non-conducting samples, and be affected as little as possible by the corrections caused by the measuring instruments. A semiconductor element should be subjected to as few as possible preparation steps in order to allow for such measurements. It is furthermore a specific need for quality control during production and development of semiconductor elements to determine the spatial distribution of the electrically active charge carriers therein. In particular, after annealing of doped semiconductor elements it is uncertain which part of the dopants is of significance electrically and what is the actual spatial distribution of these charge carriers in the semiconductor element. Submicron device development and fabrication hinges on the tight control of dopant incorporation and (re)distribution during the whole fabrication process. Facing the increasing costs for processing, extensive usage of process and device simulation programs (TCAD) has become a standard in technology development. However since advanced processes contain numerous less well characterized processing steps (like short time anneals, transient diffusion, stress induced diffusion, 2D-diffusion . . . ), models are not yet completely predictive. Calibration of TCAD-tools and further model development are therefore essential activities for semiconductor companies involved in deep submicron technology. An important restriction in the successful application of this strategy is the availability of suitable characterization methods. With decreasing device dimensions the requirements posed on the analysis tools have increased from moderate requirements on 1D-depth resolution and sensitivity applied to simple test structures to very stringent requests related to 2D-resolution (nm!), quantification accuracy (2-5%) and the capability to probe directly on devices. Concurrent with the TCAD-needs are the demands from failure analysis for high spatial resolution analysis of devices.
Scanning proximity microscopes are known in the prior art. Said microscopes are capable of imaging the surface of a substrate with atomic resolution. Conventional scanning proximity microscopes provide signals which correspond to changes in the topography of the sample under investigation. Scanning probe technology already has gained wide access in the semiconductor fabrication particularly for surface roughness (with sub-nm sensitivity) and dimensional metrology. The extension from a pure topographical measurement towards a more functional analysis (carrier or potential profiling) by the (additional) acquisition of a relevant electrical signal might lead to a method satisfying the TCAD- and failure analysis needs in terms of the required 2D-resolution, electrical information and applicability to devices.
Techniques are known in the prior art by which the potential distribution of a semiconductor element can be measured. The paper
Scanning Tunneling Potentiometry
, Appl. Phys. Lett. 48, 514 (1986) by Muralt and Pohl discloses a method for measuring the potential distribution on conductor/semiconductor elements by using a scanning tunneling microscope (STM). In said method the different frequencies constituting the tunneling current between a conducting tip and the semiconducting/conducting element under investigation are separated in order to obtain electrical potential characteristics. Said method suffers from the disadvantage that the STM-tip does not make contact with the semiconducting/conducting element under investigation. Further, the measured potential distribution is disturbed by the tunneling current, injected in the semiconducting/conducting element under investigation. Said method furthermore is sensitive to the presence of contaminants present on the semiconducting/conducting element under investigation. M. Anders et al., in the paper
Potentiometry for Thin
-
Film Structures using Atomic Force Microscopy,
J. Vac. Sci. Technol.A8, 394 (1990) discloses a STM/AFM based noncontact potential measurement. Said method is disturbed by the tunneling current, injected in the semiconducting/conducting element under investigation and is sensitive to the presence of contaminants present on the semiconducting/conducting element under investigation. U.S. Pat. No. 5,122,739 discloses a method and apparatus for measuring node voltages on integrated circuits. Said method and apparatus are based on the STM-technique. Nonnenmacher et al. disclose in the paper
Kelvin Probe Force Microscopy,
Appl. Phys. Lett. 58, 2921 (1991) a method for measuring the contact potential difference between different materials using Kelvin Probe Force Microscopy. The prior art fails to disclose a method to measure the electrical potential in semiconductor element without disturbing said electrical potential. The cited references fail to disclose a method to measure the electrical potential in a semiconductor element that is insensitive to the presence of contaminants on the surface of the semiconducting/conducting elements under investigation. The cited references fail to disclose a method that is a method that allows simultaneous measurements of the topography and the potential distribution of semiconductor elements and related/derived characteristics thereof using a scanning proximity microscope in contact mode.
SUMMARY OF THE INVENTION
The present invention provides a new method for measuring the potential distribution in a semiconductor element. The present invention advantageously exploits the technology from conventional Atomic Force Microscopy (AFM) and/or Scanning Tunneling Microscopy (STM) combined with one or more conducting probes to map the potential distribution in a semiconductor element. The measured potential distribution can be used for applications such as process control, process optimization, TCAD device simulator calibration, the determination of charge carrier distributions in semiconductor elements and other applications.
For this purpose, the invention provides a method for measuring the electrical potential on a semiconductor element comprising the steps of applying one or more voltages over the semiconductor element and placing one or more conductors in contact with the semiconductor element using a scanning proximity microscope. An electrical potential in the semiconductor element is measured with at least one of the conductors while injecting a substantially zero current in said semiconductor element. The term “substantially zero current” as used herein and the claims means a lower value than the value of a tunneling current. In an embodiment of the invention, the contact force between the conductors and the semiconductor element is calibrated.
Advantageously, a scanning proximity microscope (SPM), such as an AFM (Atomic Force Microscope), is employed to keep the contact force and/or distance between the probe and the semiconductor element constant, and to move the probe and semiconductor element relative to each other. Because of the standard resolution of such a scanning proximity mi
de Wolf Peter
Hellemans Louis C.
Trenkler Thomas
Vandervorst Wilfried
IMEC
Kerveros James
Metjahic Safet
Ostrolenk Faber Gerb & Soffen, LLP
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