Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1995-06-07
1998-10-20
Breneman, R. Bruce
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438718, 438694, 216 81, H01L 21302
Patent
active
058246037
ABSTRACT:
This is a device and method of forming such, wherein the device has an amorphous "TEFLON" (TFE AF) layer. The device comprising: a substrate; a TFE AF 44 layer on top of the substrate; and a semiconductor layer 42 on top of the TFE AF 44 layer. The device may be an electronic or optoelectronic device. The semiconductor layer may be a metal or other substance.
REFERENCES:
patent: 3136680 (1964-06-01), Hochberg
patent: 4530569 (1985-07-01), Squire
patent: 4886699 (1989-12-01), Carroll et al.
patent: 4933060 (1990-06-01), Prohaska et al.
patent: 5011732 (1991-04-01), Takeuchi et al.
patent: 5061938 (1991-10-01), Zahn et al.
patent: 5282258 (1994-01-01), Hoshino
patent: 5286550 (1994-02-01), Yu et al.
patent: 5302547 (1994-04-01), Wojnarowski et al.
patent: 5312716 (1994-05-01), Unoki et al.
patent: 5380474 (1995-01-01), Rye et al.
patent: 5401687 (1995-03-01), Cole et al.
patent: 5403437 (1995-04-01), Beratan et al.
patent: 5407860 (1995-04-01), Stoltz
patent: 5468561 (1995-11-01), Cho
"Improved Adhession of Copper on Pre-Etched Polytetrafluoroethylene By PECVD Deposited Thin Metallic Layers"; Appl. Phys. A. (1988), A47(2); pp. 199-203; Haag et al.
"Contact Angle Hysteresis In Oxygen Plasma Treated Polytetrafluoroethylene"; Langmuir (1989); 5(3); pp. 872-876; Morra et al.
Breneman R. Bruce
Denker David
Donaldson Richard L.
Goudreau George
Kesterson James C.
LandOfFree
Method of forming a low-K layer in an integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming a low-K layer in an integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a low-K layer in an integrated circuit will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-243967