Structure and method of measuring electrical characteristics of

Details Structure and method of measuring electrical characteristics of Structure and method of measuring electrical characteristics of

1998-02-17

1999-08-31

Do, Diep

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324 714, 324724, G01N 2707, G01R 2708

Patent

active

059458321

ABSTRACT:
A method of measuring electrical characteristics of a molecule including providing a first metal contact having a major surface, an insulating layer overlying the major surface of the first metal contact and a second metal contact overlying the insulating layer so as to have an edge spaced a molecular distance from the major surface of the first metal contact. A conductive organic molecule including a metal binding group is coupled between the metal contacts.

REFERENCES:
patent: 3995216 (1976-11-01), Yun
patent: 5457396 (1995-10-01), Mori et al.

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