Method of detecting the inclination of an IC

Details Method of detecting the inclination of an IC Method of detecting the inclination of an IC

1993-06-08

1995-07-18

Voeltz, Emanuel T.

Boots, shoes, and leggings

382145, G06K 952

Patent

active

054348021

ABSTRACT:
The present invention provides a method of detecting the inclination of an IC to determine its position for arranging the sides of the IC parallel to an X-axis and Y-axis speedily and precisely without using image information of binarized images or an image of each pin. This method includes the steps of: inputting an image of an IC; defining a plurality of checking areas at predetermined positions in the image, wherein each checking area includes open ends of a plurality of IC pins; generating a density projection along a direction parallel to IC pins in each checking area; detecting the maximum value of a primary differential at the open ends of the IC pins; defining a representative point at a predetermined position on a line along the open ends; and calculating inclination of the IC according to the inclination of a reference line connecting the representative points of the checking areas.

REFERENCES:
patent: 4424588 (1984-01-01), Satoh et al.
patent: 4450579 (1984-05-01), Nakashima et al.
patent: 4845764 (1989-07-01), Ueda et al.
patent: 4981372 (1991-01-01), Morimoto et al.
Loomis, "Edge-Finding Algorithm with Subpixel Resolution", Vision '89, Conference Proceedings, Apr. 1989, pp. 8-33 to 8-46.

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