Scanning probe microscope for observing a sample surface while a

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium

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Details

369101, 250306, 250307, G11B 900, H01J 37285

Patent

active

054815290

ABSTRACT:
The present invention relates to a scanning probe microscope for observing the surface of a sample therethrough by the use of a probe including a probe, means for causing the sample and the probe to scan relative to each other, means for applying an AC voltage between the sample and the probe, and means for detecting an electric current flowing between the sample and the probe at a predetermined phase point of the AC voltage, the surface of the sample being observed on the basis of the detected electric current. The specification also discloses an information recording-reproducing apparatus using such probe microscope.

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patent: 5391871 (1995-02-01), Matsuda
patent: 5414260 (1995-05-01), Takimoto et al.
"Surface Studies by Scanning Tunneling Microscopy" by G. Binning et al., Physical Review Letters, vol. 49; No. 1, Jul. 5, 1982; pp. 57-61.

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