Optical pattern tracing system with remotely controlled kerf and

Details Optical pattern tracing system with remotely controlled kerf and Optical pattern tracing system with remotely controlled kerf and

1979-12-31

1983-02-01

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controls its own optical systems

318577, G05B 100

Patent

active

043717829

ABSTRACT:
An optical scanner for a pattern tracing system for scanning an irregular two-dimensional pattern using an optical beam deflection principle. A scanning head is non-rotatably mounted above the pattern on a frame moveable in two coordinate directions. The scanning head reflects an image onto the pattern by a pivotally mounted mirror in the scanning head and is deflected at high frequency in two normally orthogonal planes by the interaction of a pair of perpendicularly related electromagnets with a permanent magnet. The geometric axis of the mirror nutates around a scan axis to provide a generally circular scan image on the pattern. The axis about which the mirror nutates, referred to as the scan axis, is shiftable from a fixed reference axis to achieve offsets for the scan image to provide both forward offset and "kerf" offset perpendicular to the forward offset. A control circuit derives out of phase alternating signals for the two scanner coils to cause this nutational motion of the mirror. The offset of the axis of nutation from the reference axis is effected by the application of direct current signals to these coils.

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