Data-input device for generating test signals on bit and bit-com

Details Data-input device for generating test signals on bit and bit-com Data-input device for generating test signals on bit and bit-com

1996-01-19

1998-12-01

Palys, Joseph

Excavating

39518318, 371 211, 371 271, 371 214, G06F 1100

Patent

active

058450599

ABSTRACT:
A data input circuit is used in a memory device having an externally accessible data pin. The data input circuit includes first and second data output terminals and a test terminal that receives a test signal. A data converter is coupled to the first and second data output terminals and to the test terminal, and places complementary signal levels on the first and second data output terminals when the test signal is absent from the test terminal, and places a same signal level on both the first and second data output terminals when the test signal is present on the test terminal. The data input circuit may include an input terminal that is coupled to the data pin, where the data converter is coupled to the input terminal. When the test signal is present on the test terminal, the data converter places on the first data output terminal a signal level equal to a signal level that occupies the data pin during a first time period, and places on the second data output terminal a signal level equal to a signal level that occupies the data input terminal during a second time period.

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