Radiant energy – Ionic separation or analysis – Methods
Patent
1998-03-26
1999-12-28
Berman, Jack I.
Radiant energy
Ionic separation or analysis
Methods
H01J 4900
Patent
active
060084901
ABSTRACT:
An analyzing portion searches a mass spectrum for a mass peak exceeding a threshold level and adds the mass corresponding to the searched peak to the mass differences listed in an adduct ion table stored in a table, thereby forming a quasi-mass spectrum. The analyzing portion compares the formed quasi-mass spectrum with a measured mass spectrum in terms of mass. If agreement in mass between both the spectra is found, an index S is incremented by one and finally a total value of the index S is calculated. The analyzing portion then searches for another mass peak exceeding the threshold level and executes a similar process. Resulting values of the indexes S are compared with each other and probabilities of m/z and adduct ions are output to a display portion. Emergence frequency is counted for each of detected ion types and stored in storage means. If the measurement is executed in a predetermined number of times, then a greater weight is allocated to the ion types having larger emergence frequency, followed by updating the adduct ion table stored in the table. That arrangement realizes a method and apparatus for measuring and analyzing a mass spectrum by which a quasi-molecular ion and hence the molecular weight of a sample can be quickly estimated with high accuracy while preventing an error from being mixed in the process of analysis.
REFERENCES:
patent: 4144451 (1979-03-01), Kambara
patent: 4769540 (1988-09-01), Mitsui et al.
patent: 5072115 (1991-12-01), Zhou
patent: 5103093 (1992-04-01), Sakairi et al.
patent: 5247175 (1993-09-01), Schoen et al.
patent: 5352891 (1994-10-01), Monnig et al.
Anal. Chem. 1989, 61, 1159-1164, Minoru Sakairi & Hideki Kambara: Atmospheric Pressure Spray Ionization for Liquid Chromatography/Mass Spectrometry, pp. 1159-1164.
Anal. Chem., vol. 62, No. 13, Jul. 1, 1990, Eric C. Huang et al.: Atmospheric Pressure Ionization Mass Spectrometry, pp. 713-725.
Berman Jack I.
Hitachi , Ltd.
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