Position detecting method and apparatus including Fraunhofer dif

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

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356355, 356400, 356401, G01B 1102

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active

053251768

ABSTRACT:
A device usable with a first object and a second object at least one of which is provided with a diffraction grating, for detecting the position of the second object relative to the first object, is disclosed. The device includes a light source for projecting a position detecting beam upon the first object; a beam detecting portion for receiving the position detecting beam after it is directed from the first object and being incident on the second object, the beam detecting portion receiving the position detecting beam to detect the position of the second object relative to the first object; wherein at least one diffraction grating is disposed in the path of the position detecting beam to be received by the beam detecting portion, which diffraction grating is effective to diffract the position detecting beam at least twice and wherein the beam detecting portion is disposed at a site effective not to receive unwanted diffraction light produced from the or at least one diffraction grating.

REFERENCES:
patent: 4037969 (1977-07-01), Feldman et al.
patent: 4211489 (1980-07-01), Kleinknecht et al.
patent: 4311389 (1982-01-01), Fay et al.
patent: 4326805 (1982-04-01), Feldman et al.
patent: 4360273 (1982-11-01), Thaxter
patent: 4371264 (1983-02-01), Lacombat et al.
patent: 4398824 (1983-08-01), Feldman et al.
patent: 4514858 (1985-04-01), Novak
patent: 4545683 (1985-10-01), Markle
patent: 4631416 (1986-12-01), Trutna, Jr.
patent: 4704033 (1987-11-01), Fay et al.
patent: 4771180 (1988-09-01), Nomura et al.
patent: 4815854 (1989-03-01), Tanaka et al.
patent: 4835078 (1989-05-01), Harvey et al.
patent: 5160848 (1992-11-01), Saitoh et al.
Feldman, et al., "Application of Zone Plates to Alignment in X-ray Lithography," Optical Engineering, vol. 22, No. 2, Mar. 1983, pp. 203-207.
Hutley, "Nonspectroscopic Uses of Diffraction Gratings", Diffraction Gratings, (1982), pp. 293-313 and 318-325.

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