Small propagation delay measurement for digital logic

Details Small propagation delay measurement for digital logic Small propagation delay measurement for digital logic

1986-02-24

1987-12-08

Tokar, Michael J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Phase comparison

307352, 375 22, 379 90, 324 57DE, G01R 2500

Patent

active

047120614

ABSTRACT:
A circuit for measuring small propagation delays associated with a digital logic circuit has first and second signal paths. The first signal path in the digital logic circuit has at least a first predetermined number of devices and has an input and an output. Similarly, the second signal path in the digital logic circuit has at least a second predetermined number of devices and also has an input and an output. The first predetermined number of devices is different than the second predetermined number of devices. An input multiplexer multiplexes a predetermined input signal to the inputs of the first and second signal paths. First and second output signals are thereby produced on the outputs of the first and second signal paths, respectively. An output multiplexer causes the output signals to be combined into a single multiplexed output signal. An average propagation delay is determined from the differential area between the output signals in the multiplexed output signal.

REFERENCES:
patent: 4064378 (1977-12-01), Kitayama
patent: 4179660 (1979-12-01), Zeis
patent: 4392105 (1983-07-01), McLeod
patent: 4489272 (1984-12-01), McLeod
patent: 4584559 (1986-04-01), Penney

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