Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1991-12-26
1994-10-18
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
365201, 371 211, G01R 3128, G11C 700
Patent
active
053571932
ABSTRACT:
An semiconductor device includes an integrated circuit having first and second circuit sections formed on a semiconductor chip, at least one voltage stress testing pad formed on the semiconductor chip for supplying a voltage stress testing voltage or signal to the first circuit section, and a control circuit formed on the semiconductor chip for controlling and setting the second circuit section into a state corresponding to a voltage stress testing mode by using an input from the voltage stress testing pads.
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"Fast Method Used To Stress and Test Memory Arrays", IBM Technical Disclosure Bulletin, vol. 29, No. 12, May 1987, Armonk, N.Y., pp. 5534-5535.
Koyanagi Masaru
Tanaka Hiroaki
Kabushiki Kaisha Toshiba
Karlsen Ernest F.
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