Image processing apparatus and method for inspecting defects of

Details Image processing apparatus and method for inspecting defects of Image processing apparatus and method for inspecting defects of

1992-08-21

1996-10-22

Couso, Yon J.

Image analysis

Applications

Manufacturing or product inspection

382168, G06K 900

Patent

active

055685641

ABSTRACT:
The present invention provides an image processing apparatus for inspecting defects of enclosure of semiconductor devices, comprising first histogram memory means for storing a relative density degree of a first image signal or a reference signal, second histogram memory means for storing a relative density degree of a second image signal of an object to be inspected, third histogram memory means for storing an accumulated value of the relative degree supplied from the first histogram memory, fourth histogram memory means for storing an accumulated value of the relative degree supplied from the second histogram memory, and coincidence degree detection means for detecting the coincidence degree between data from the third histogram memory means and the fourth histogram memory means.

REFERENCES:
patent: 4472736 (1984-09-01), Ushino et al.
patent: 4484081 (1984-11-01), Cornyn, Jr. et al.
patent: 4543659 (1985-09-01), Ozaki
patent: 4701859 (1987-10-01), Matsuyama et al.
European Search Report No. EP 89108384 dated Oct. 30, 1990.
Shima et al., "An Automatic Visual Inspection Method for a Plastic Surface Based on Image Partitioning and Gray-Level Histograms," Systems and Computers In Japan, vol. 17, No. 5, 1986.
Patent Abstracts of Japan, vol. 6, No. 241 (P-158) (1119), Nov. 30, 1982.

Affiliated with

Also associated with

Rating

Image processing apparatus and method for inspecting defects of does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Image processing apparatus and method for inspecting defects of , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image processing apparatus and method for inspecting defects of will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2365839