Method for the registration and representation of signals in the

Details Method for the registration and representation of signals in the Method for the registration and representation of signals in the

1984-07-19

1987-02-10

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, G01R 3128, G01R 3126

Patent

active

046425667

ABSTRACT:
A respective threshold circuit is provided for defining upper and lower thresholds representing logic levels of signals occuring within integrated circuits. The chronological position of a signal edge and the steepness of the signal edge are defined with the assistance of the two thresholds.

REFERENCES:
patent: 3359491 (1967-12-01), McCutcheon
patent: 4045736 (1977-08-01), Carpenter et al.
patent: 4277679 (1981-07-01), Feuerbaum
Feuerbaum, H. P.; "VLSI Testing Using the Electron Probe"; Scanning Electron Microscopy; 1979; vol. 1; pp. 285-296;
Fazekas P., et al., "Scanning Electron Beam Probes VLSI Chips", Electronics, Jul. 14, 1981, pp. 105-112.

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