Semiconductor memory circuit having inspection circuit

Details Semiconductor memory circuit having inspection circuit Semiconductor memory circuit having inspection circuit

1986-12-29

1989-07-25

Hecker, Stuart N.

Static information storage and retrieval

Read only systems

365105, 365201, G11C 700, G11C 1700, G11C 1706

Patent

active

048520586

ABSTRACT:
A semiconductor memory circuit includes a plurality of programmable memory cells capable of being programmed by a predetermined current; a plurality of bit lines connected with memory cells, a plurality of current distributors corresponding to the bit lines for connecting selected bit lines to an output terminal based on selection signals and separating non-selected bit lines from the output terminal, and a plurality of switching circuits corresponding to the bit lines for connecting non-selected bit lines to a low level potential point based on the selection signals. The determination of the existence of the inter-cell leakage is carried out precisely and easily.

REFERENCES:
patent: 4276617 (1981-06-01), Le
patent: 4319341 (1982-03-01), Fukushima et al.
patent: 4385368 (1983-05-01), Principi et al.
patent: 4459694 (1984-07-01), Ueno et al.
patent: 4639895 (1987-01-01), Iwahashi et al.

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