Testing device for printed circuit boards

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324 73PC, 324158P, G01R 3102, G01R 106

Patent

active

046367233

ABSTRACT:
A two level test device for testing printed circuit boards is disclosed, including a housing defining an open chamber and a support platform displaceably connected with the housing for closing the chamber and for supporting the circuit board to be tested. A vacuum device is connected with the housing for creating a negative pressure within the chamber to displace the platform from a first rest position to second and third test positions. In the platform second position, the circuit board contacts the terminal of a test pin for functional testing of the board and in the platform third position, the circuit board contacts the terminals of a pair of test pins for in-circuit testing of the circuit board. The test device is characterized by a stop plate for arresting displacement of the platform in its second and third positions. The stop plate includes a plurality of projections and the housing bottom wall contains a plurality of recesses corresponding with the projections. When the stop plate is in a first position, the projections engage the upper surface of the housing bottom wall to stop the platform displacement in its second position. When the stop plate is laterally shifted to a second position, the projections enter the corresponding recesses and the lower surface of the stop plate abuts against the upper surface of the housing bottom wall to stop the platform displacement in its third position. A piston/cylinder assembly shifts the stop plate between the first and second positions.

REFERENCES:
patent: 3089925 (1963-05-01), Landstrom et al.
patent: 4115735 (1978-09-01), Stanford
patent: 4164704 (1979-08-01), Kato et al.
patent: 4230985 (1980-10-01), Matrone et al.
patent: 4321533 (1982-03-01), Matrone
patent: 4496903 (1985-01-01), Paulinski
patent: 4536051 (1985-08-01), Smith et al.
"Testing Apparatus with Selectable Probes and Contactors for Use with Changeable Patterns", by Faure et al., IBM Tech. Disc. Bull., 2/78, vol. 20, #9, pp. 3461-3462.

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