1991-06-26
1992-04-14
Wojciechowicz, Edward J.
357 16, 357 15, 357 61, 357 89, H01L 2980
Patent
active
051052415
ABSTRACT:
In a filed effect transistor utilizing two-dimensional electron gas as an active layer, an improvement to increase sheet electron density in a cap layer has been made by inserting into the cap layer at an interface with a carrier supplying layer, a thin film comprising a material having an electron affinity larger than that of a material constituting the cap layer. Further by employing a non-doped material for this thin film layer, electron mobility in the cap layer can also be improved. Thus source resistance of the field effect transistor has been reduced.
REFERENCES:
patent: 4987462 (1991-01-01), Kim et al.
Henderson et al., "Microwave Performance of a Quarter-Micrometer Gate Low-Noise Pseudomorphic . . . Transistor," IEEE Electron Device Letters, vol. EDL-7, No. 12, Dec. 1986.
NEC Corporation
Wojciechowicz Edward J.
LandOfFree
Field effect transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Field effect transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Field effect transistor will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2353139