Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Patent
1989-07-27
1991-05-21
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With raman type light scattering
G01J 344
Patent
active
050170074
ABSTRACT:
A surface-enhanced Raman spectroscopy (SERS) assembly comprises a radiant energy source for directing a beam of radiant energy toward a target microbase. The target microbase includes a substrate, a roughened surface layer contiguously disposed on the substrate, and a sample-adsorption surface layer contiguously disposed on the first roughened layer. The sample-adsorption surface layer is effective to enhance a scattered Raman signal intensity for adsorbates adjacent the sample-adsorption surface layer by a factor of greater than 10.sup.6 times. The sample-adsorption surface includes a plurality of submicron needles having a length of at least 3500 angstroms and a width of at least 500 angstroms. A method for manufacturing the target microbase comprises the steps of contiguously depositing on a substrate the first roughened layer having a deposited thickness of at least 1700 angstroms. A further metallic layer is then contiguously grown on the first roghened layer to form needles modeled as prolate spheroids having a length of at least 3500 angstroms and a width of at least 500 angstroms. In a specific embodiment, the needles are silver microneedles deposited from a vapor with a closed chamber and a vacuum pressure of at least 10.sup.-4 torr and at an evaporation rate from 2 to 20 angstroms per second. The silver microneedles are formed at a deposited thickness of at least 4000 angstroms as determined by a standard quartz thickness monitor.
REFERENCES:
patent: 3512876 (1970-05-01), Marks
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patent: 4674878 (1987-06-01), Vo-Dinh
patent: 4781458 (1988-11-01), Angel et al.
Bloemer et al., "Surface Electromagnetic Modes in Prolate Spheroids of Gold, Aluminum and Copper", J. Opt. Soc. Am., vol. 5, #12, 12188, pp. 2552-2559.
Vo-Dinh et al., "Surface-Enhanced Roman Spectroscopy for Trace Organic Analysis", Analytical Chemistry, vol. 56, #9, 8/84, pp. 1667-1670.
Bailey David L.
Milne Christopher G.
Shelby, Jr. Paulus P.
Evans F. L.
Hartis K. P.
Markva Neil F.
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