Multi-probe system for dimensional metrology

Details Multi-probe system for dimensional metrology Multi-probe system for dimensional metrology

1996-06-20

1998-10-20

Bennett, G. Bradley

Geometrical instruments

Gauge

Movable contact probe, per se

33557, G01B 703

Patent

active

058228772

ABSTRACT:
A multi-probe system for dimensional metrology. This system utilizes a probe base that is attachable to a coordinate measuring machine and that includes a plurality of probes mounted at spaced-apart locations on the base. The probes are interconnected with the coordinate measuring machine and generate measurement signals based upon interaction with a workpiece. By providing a plurality of probes on a single assembly, multiple measurements can be made on a workpiece in a single measurement cycle.

REFERENCES:
patent: 2909842 (1959-10-01), Aller
patent: 3325903 (1967-06-01), Zurlinden
patent: 3869799 (1975-03-01), Neuer et al.
patent: 4136458 (1979-01-01), Bell et al.
patent: 4153998 (1979-05-01), McMurty
patent: 4221053 (1980-09-01), Bobel, II et al.
patent: 4785545 (1988-11-01), Aubele
patent: 4972594 (1990-11-01), Gurny et al.
patent: 4978857 (1990-12-01), Juengel
patent: 5014440 (1991-05-01), Lessi et al.
patent: 5526576 (1996-06-01), Fuchs et al.

Affiliated with

Also associated with

Rating

Multi-probe system for dimensional metrology does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multi-probe system for dimensional metrology, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multi-probe system for dimensional metrology will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-232398