Process for fabricating device having titanium-tungsten barrier

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437200, 437201, H01L 2144, H01L 21443

Patent

active

054570697

ABSTRACT:
A process for fabricating a device having a TiW barrier layer and a relatively shallow junction contacted with a silicide layer wherein said TiW barrier layer and said silicide layer are simultaneously formed comprising steps of preparing a Si substrate, applying a layer including therein a Ti and an appropriate X element such as Co or Pt on the Si substrate, applying a W layer on the layer including therein the Ti and the X element for forming a W/X-Ti/Si structure, and transforming the W/X-Ti/Si structure into a TiW/silicide/Si structure to obtain the device having a TiW barrier layer and a silicide layer contacted shallow junction. The present invention provides a simplified process for fabricating such a device having therewith a junction of a low resistance and a high temperature stability.

REFERENCES:
patent: 4478881 (1984-10-01), Bartus et al.
patent: 4870033 (1989-09-01), Hotta et al.
patent: 5084417 (1992-01-01), Joshi et al.
patent: 5208170 (1993-04-01), Kobeda et al.
patent: 5302552 (1994-04-01), Duchateau et al.
T. G. Finstad, et al. "Interaction of Evaporated Pd and Ti Films With Single Crystal Silicon" Thin Solid Films 68 (1980) pp. 393-405.
"Ti-Walloy interaction with silicon in the presence of PtSi" J. Appl. Phys. 54(5) May 1983 pp. 2434-2440 F. Nava, et al.
Fann-Mei Yang et al., Formation of self-aligned cobalt silicide in normal flow nitrogen furnace, Thin Solid Films, vol. 207, pp. 75-81, Taiwan, 1992.
M. Lawrence A. Dass et al., Growth of epitaxial CoSi.sub.2 on (100)Si, Appl. Phys. Lett., vol. 58, No. 12, pp. 1308-1310, Mar. 1991.
Fann-Mei Yang et al., Formation of cobalt silicide under a passivating film of molybdenum or tungsten, J. Vac. Sci. Tech., vol. B9, No. 3, pp. 1497-1502, May/Jun. 1991.
Marvin Tabasky et al., Direct Silicidation of Co on Si by Rapid Thermal Annealing, IEEE Transactions of Electron Devices, vol. ED-34, No. 3, pp. 548-553, Mar. 1987.
A. E. Morgan et al., Characterization of a Self-Aligned Cobalt Silicide Process, J. Electro. Chem. Soc., vol. 134, No. 4, pp. 925-935, Apr. 1987.
L. Van den hove et al., A self-aligned cobalt silicide technology using rapid thermal processing, J. Vac. Sci. Tech. vol. B4, No. 6, pp. 1358-1363, Nov./Dec. 1986.
S. P. Murarka, Silicides for VLSI Applications, Academic Press, New York, pp. 130, 169, 1983.
M. Eizenberg et al., Formation of shallow silicide contacts of high Schottky barrier on Si: Alloying Pd and Pt with W vs alloying Pd and Pt with Si, J. Appl. Phys., vol. 53, No. 3, pp. 1577-1585, Mar. 1982.
G. Ottaviani et al., Phase separation in alloy-Si interaction, Appl. Phys. Lett., vol. 36, No. 4, pp. 331-333, 15 Feb. 1980.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Process for fabricating device having titanium-tungsten barrier does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process for fabricating device having titanium-tungsten barrier , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process for fabricating device having titanium-tungsten barrier will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2310292

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.