X-ray analyzer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Patent

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Details

378 44, 378 46, 378 72, G01N 2320

Patent

active

049167200

ABSTRACT:
An X-ray analyzer for performing both X-ray fluorescence and X-ray diffraction analysis is provided with an X-ray source, an X-ray guide tube for collimating X-rays from the source, a vacuum tank in which the guide tube is partially disposed, a rotatable sample table for holding a sample adjacent the guide tube, and an X-ray detector movable away from and towards the sample table, and also rotatable independently of the sample table.

REFERENCES:
patent: 3344274 (1967-09-01), Ashby et al.
patent: 3440419 (1969-04-01), Das Gupta et al.
patent: 3903414 (1975-09-01), Herbstein et al.
patent: 4263510 (1987-04-01), Ciccarelli et al.

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