X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1988-11-15
1990-04-10
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 44, 378 46, 378 72, G01N 2320
Patent
active
049167200
ABSTRACT:
An X-ray analyzer for performing both X-ray fluorescence and X-ray diffraction analysis is provided with an X-ray source, an X-ray guide tube for collimating X-rays from the source, a vacuum tank in which the guide tube is partially disposed, a rotatable sample table for holding a sample adjacent the guide tube, and an X-ray detector movable away from and towards the sample table, and also rotatable independently of the sample table.
REFERENCES:
patent: 3344274 (1967-09-01), Ashby et al.
patent: 3440419 (1969-04-01), Das Gupta et al.
patent: 3903414 (1975-09-01), Herbstein et al.
patent: 4263510 (1987-04-01), Ciccarelli et al.
Hosokawa Yoshinori
Takano Yukio
Yamamoto Naoki
Yoshino Kenji
Fields Carolyn E.
Hitachi , Ltd.
Horiba Ltd.
Porta David P.
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