1977-01-31
1978-06-27
Sikes, William L.
350285, G02F 116
Patent
active
040971236
ABSTRACT:
The system herein includes an array of light beam reflecting surfaces and reflection control means for effecting changes in the position of a light beam along the scan-line output surface of the system with a much higher degree of sensitivity than is possible with the more well known line scan light beam deflection systems. This is accomplished primarily by allowing the reflection control means of the system to utilize scan angle magnifying means which are an inherent characteristic of the system in combination with repeated use of beam reflection control means therein.
REFERENCES:
patent: 4004847 (1977-01-01), McNaney
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