Method and arrangement for the functional testing of computers

Details Method and arrangement for the functional testing of computers Method and arrangement for the functional testing of computers

1983-08-05

1986-12-02

Atkinson, Charles E.

Excavating

371 27, G01R 3128

Patent

active

046270574

ABSTRACT:
Method and arrangement for the functional testing of computers used in the control of processes. A data word signal generated by the computer is compared in a comparator with a test word of the same bit length generated by a pseudo-random number generator. When the two words are completely coincident, the comparator issues a trigger pulse to two non-retriggerable monoflops which provide a time frame and the function of which is acknowledged dynamically to the computer through an acknowledgement line, which provides a shift clock pulse for the pseudo-random number generator upon the lapse of the window frame. When a fault arises in the computer or in the check unit, an alarm unit is triggered through an NOR gate to transfer the process into a defined safe state. All faults in the check unit itself can be detected by the computer through acknowledgement lines.

REFERENCES:
patent: 3582633 (1971-06-01), Webb
patent: 3924181 (1975-12-01), Alderson
patent: 3931506 (1976-01-01), Borrelli et al.
patent: 4108359 (1978-08-01), Proto
patent: 4251885 (1981-02-01), Dodt et al.
patent: 4317167 (1982-02-01), Hartig et al.
patent: 4347608 (1982-08-01), Appiano et al.
patent: 4365334 (1982-12-01), Smith et al.
patent: 4380068 (1983-04-01), de Couasnor
patent: 4468768 (1984-08-01), Sunkle et al.

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