Method of calibrating reflectance measuring devices

Details Method of calibrating reflectance measuring devices Method of calibrating reflectance measuring devices

1986-06-23

1988-03-08

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrophotometer

356446, G01J 302

Patent

active

047296577

ABSTRACT:
A method of calibrating reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a secondary reflectance standard for several wavelengths are calculated and stored in a memory of a reflectance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true reflectance of the test sample.

REFERENCES:
patent: 3828173 (1974-08-01), Knepler
patent: 3874799 (1975-04-01), Isaacs et al.
patent: 4526470 (1985-07-01), Kaye

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