Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1989-06-29
1992-03-10
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324689, 324685, G01R 2726
Patent
active
050952781
ABSTRACT:
A planar interdigitated dielectric sensor useful for measuring the surface properties of a material is disclosed. The sensor is formed on an insulating substrate. Attached to the surface of the substrate is an excitation electrode and a response electrode disposed in an interdigitated pectinate configuration and a resistance temperature device a (metallic strip). Filling the space between the electrodes and the metallic strip is an insulating material of known dielectric properties. The upper surface of the electrodes and the metallic strip are generally coplanar with respect to the insulating material between the electrodes thus forming a flat upper surface on the sensor. This flat upper surface serves to eliminate air gaps between the sensor surface and sample when analyzing relatively viscous materials.
REFERENCES:
patent: 3696360 (1972-10-01), Gajewski
patent: 3879644 (1975-04-01), Maltby
patent: 4277742 (1981-07-01), Kovac
patent: 4423371 (1983-12-01), Senturia et al.
patent: 4510436 (1985-04-01), Raymond
patent: 4654598 (1987-03-01), Arulanadan et al.
patent: 4710550 (1987-12-01), Kranbuehl
patent: 4723908 (1988-02-01), Kranbuehl
Society for Advancement of Material and Process Engineering Journal, vol. 19, No. 4, Jul./Aug. 1983.
Solis Jose M.
TA Instruments, Inc.
Wieder Kenneth A.
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