Portable wedge probe for perusing signals on the pins of an IC

Details Portable wedge probe for perusing signals on the pins of an IC Portable wedge probe for perusing signals on the pins of an IC

1997-03-27

1999-07-13

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 1073

Patent

active

059231777

ABSTRACT:
A portable wedge probe for perusing the signals of an IC is produced by mounting a short row of wedges in a housing that serves the dual purposes of: (1) Allowing the gripping and manipulation of the wedges for inspection, the connecting and unconnecting of interconnecting cables, deployment onto, and removal from, the IC; and (2) serving as the housing for and physical location of electrical interconnection(s) between the portable wedge probe and the cable(s) of the measurement (test) equipment. By the term "short row of wedges" we mean, say, two adjacent wedges for the signal on a single intervening interior pin of the IC, up to perhaps nine adjacent wedges for the eight signals on the eight intervening interior pins of the IC, as opposed to having the row of wedges being long enough to engage the entire side of the IC. The portable wedge probe is free standing once applied, and does not rely upon support from another row of wedges deployed on a different side of the IC.

REFERENCES:
patent: 4835465 (1989-05-01), Gergin
patent: 5463324 (1995-10-01), Wardwell et al.
patent: 5506515 (1996-04-01), Godshalk et al.
patent: 5507652 (1996-04-01), Wardwell
patent: 5701086 (1997-12-01), Wardwell

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