Position measuring method and apparatus

Details Position measuring method and apparatus Position measuring method and apparatus

1983-09-21

1986-06-17

Lall, Parshotam S.

Boots, shoes, and leggings

356 4, 364559, 33 1L, G01C 308

Patent

active

045959919

ABSTRACT:
A process and apparatus for obtaining harmonic-free periodic signals in an incremental measuring system is disclosed in which a graduation having a graduation period P is scanned by at least six scanning elements (for the case in which the previously determined bandwidth N of the analog signals obtained in scanning the graduation N is equal to 3). The periodic analog signals generated by the scanning elements are subjected to a Fourier analysis for the determination of the Fourier coefficients of the base or fundamental wave of the periodic analog signals. These Fourier coefficients are then evaluated as harmonic-free periodic signals for the formation of position measuring values.

REFERENCES:
patent: 3244063 (1966-04-01), Lawrence
patent: 3523731 (1970-08-01), Mary
patent: 3674372 (1972-07-01), Weyrauch
patent: 3932745 (1976-01-01), Hartman
patent: 3951548 (1976-04-01), Westell
patent: 4173402 (1979-11-01), Horike et al.
patent: 4225931 (1980-09-01), Schwefel
patent: 4283137 (1981-08-01), Tsunekawa et al.
patent: 4334150 (1982-06-01), Herbst et al.

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