Image analysis – Applications – Manufacturing or product inspection
Patent
1995-11-30
1997-09-30
Mancuso, Joseph
Image analysis
Applications
Manufacturing or product inspection
348 95, 382287, G06K 900
Patent
active
056733348
ABSTRACT:
A method and apparatus to search, locate and inspect an object or characteristic of interest on a non-rigid package. First, a model of patterns of interest are stored to train the system with a model of the characteristics of interest. A minimum spanning forest (MSF) is generated defining the characteristics of interest as vertices with each vertex referencing a vertex closest to itself in order to minimize the sum of the distances between vertices in each minimum spanning tree (MST) of the MSF. At run time two coarse alignment features that the system has been trained to identify are located to determine rotation and coarse position of a non-rigid package being inspected. Local alignment then determines the exact position of local alignment points each of which is a starting vertex associated with one or more characteristics of interest as vertices in that starting vertexes MST. When the exact position of each local alignment point is determined the approximate position of associated characteristics is then known. Fine alignment determines the exact position of the characteristics of interest. The fine alignment process uses the minimum spanning forrest ("MSF") to locate each characteristic of interest in a selected order by reference to another, nearest, previously located characteristic.
REFERENCES:
patent: 4200861 (1980-04-01), Hubach et al.
patent: 4233625 (1980-11-01), Altman
patent: 4794648 (1988-12-01), Ayata et al.
patent: 5101448 (1992-03-01), Kawachiya et al.
patent: 5134669 (1992-07-01), Keogh et al.
patent: 5504319 (1996-04-01), Li et al.
patent: 5555101 (1996-09-01), Larson et al.
patent: 5579419 (1996-11-01), Yaguchi et al.
Li David
Nichani Sanjay
Cognex Corporation
Mancuso Joseph
Michaelis Brian L.
Weinzimmer Russ
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