Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

1995-08-16

1997-09-30

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324769, G01R 3126

Patent

active

056729820

ABSTRACT:
An object of the present invention is to make it easy to realize a method of measuring a current which flows upon deactivation of a semiconductor integrated circuit in order to test whether a damaged transistor exists in the semiconductor integrated circuit.
In order to achieve the above object, the present invention provides a semiconductor integrated circuit comprising an input node supplied with an input voltage, a reference node supplied with a reference voltage, a first source potential node supplied with a first source potential level, a second source potential node supplied with a second source potential level, a sense circuit connected between the first source potential node and the second source potential node and brought into an operating state during a period in which the first source potential level is supplied, the sense circuit comparing the input voltage and the reference voltage and outputting the result of comparison to a first node, a buffer circuit connected between the first node and an output node and adapted to output a voltage corresponding to the voltage appearing at the first node to the output node, and a first switching circuit connected between the first source potential node and the sense circuit and adapted to selectively connect between the sense circuit and the first source potential node in response to the voltage supplied to the reference node.

REFERENCES:
patent: 5440253 (1995-08-01), Araya
patent: 5508649 (1996-04-01), Shay
Nikkei Electronics, Aug. 6, 1992, No. 556, pp. 133-141.
Journal of Electronic Testing, vol. 3, No. 4, Dec. 1992, Dordrecht NE, pp. 111-120, W. Maly et al., "Design of ICs Applying Built-In Current Testing".
1993 IEEE International Test Conference, Oct. 3, 1993, Cambridge, MA, USA, pp. 596-600, F. Vargas et al., "Quiescent Current Monitoring to Improve the Realiability of Electronics Systems in Space Radiation Environments".

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